| Wavelength |
Si detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm |
| Scanned Beam Diameters |
Si detector: 5 µm to 4 mm‚ to 2 µm in Knife-Edge mode
InGaAs detector: 10 µm to 3 mm‚ to 2 µm in Knife-Edge mode
InGaAs (extended) detector: 10 µm to 2 mm‚ to 2 µm in Knife-Edge mode |
| Beam Waist Diameter Measurement |
Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
1/e² (13.5%) width
User selectable % of peak
Knife-Edge mode for very small beam |
| Measured Sources |
CW; Pulsed lasers‚ Φ µm ≥ [500/(PRR in kHz)] |
| Resolution Accuracy |
0.1 µm or 0.05% of scan range
± < 2% ± = 0.5 µm |
| Maximum Power & Irradiance |
1 W Total & 0.5 mW/µm² |
| Gain Range |
1‚000:1 Switched; 4‚096:1 ADC range |
| Displayed Graphics |
X-Y Position & Profiles‚ Zoom x1 to x16 |
| Update Rate |
~5 Hz |
| Pass/Fail Display |
On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Averaging |
User selectable running average (1 to 8 samples) |
| Statistics |
Min.‚ Max.‚ Mean‚ Standard Deviation
Log data over extended periods |
| XY Profile & Centroid |
Beam Wander display and logging |
| Minimum PC Requirements |
Windows, 2 GB RAM, USB 2.0/3.0 port |
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