| Wavelength |
Si detector: 190 to 1150 nm
InGaAs detector: 650 to 1800 nm
Si + InGaAs detectors: 190 to 1800 nm
Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm |
| Scanned Beam Diameters |
Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode*
InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*
InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode* |
| Plane Spacing (4XY models) |
100 µm: -100, 0, +100, +400 µm
250 µm: -250, 0, +250, +1000 µm
500 µm: -500, 0, +500, +2000 µm
750 µm: -750, 0, +750, +3000 µm |
| Plane Spacing (3XYKE models) |
50 µm: -50, 0, +50, 0 µm
100 µm: -100, 0, +100, 0 µm |
| Beam Waist Diameter Measurement |
Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
1/e² (13.5%) width
User selectable % of peak
Knife-Edge mode* for very small beams |
| Beam Waist Position Measurement |
± 20 µm best in X, Y, and Z — contact DataRay for recommendation |
| Measured Sources |
CW; Pulsed lasers, F µm = [500/(PRR in kHz)] |
| Resolution Accuracy |
0.1 µm or 0.05% of scan range
± < 2% ± = 0.5 µm |
| M² Measurement |
1 to > 20, ± 5% |
| Divergence/Collimation, Pointing |
1 mrad best — contact DataRay for recommendation |
| Maximum Power & Irradiance |
1 W Total & 0.5 mW/µm² |
| Gain Range |
1,000:1 Switched 4,096:1 ADC range |
| Displayed Graphics |
X-Y-Z Position & Profiles, Zoom x1 to x16 |
| Update Rate |
~5 Hz |
| Pass/Fail Display |
On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Averaging |
User selectable running average (1 to 8 samples) |
| Statistics |
Min., Max., Mean, Standard Deviation
Log data over extended periods |
| XY Profile & Centroid |
Beam Wander display and logging |
| Minimum PC Requirements |
Windows, 2 GB RAM, USB 2.0/3.0 port |
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